Nano-focus X-ray Inspection System
|
Dịch vụ - Sản phẩm >> Bán máy soi bản mạch >> X-eye NF120
Mô tả ngắn:Nano-focus X-ray Non-destructive analysis system for Wafer Level PackagingHigh-resolution image with Dual Type CTsTSV, Micro Bump, Pattern
Liên hệ: 0941.88.99.83 hoặc email: midtechvn@gmail.com - Mr. Hoàng Anh Quý!
Chi tiết:
X-ray Tube | 120 kV / 200 µA |
---|---|
Min. Resolution | 0.2㎛ |
Table Size | 12inch wafer |
Detector | 6 inch FPXD |
CT Scan Method | Oblique CT / Cone beam CT |
Foot print | 2,380 x 1,450 x 2,120 mm Control Box : 600 x 1,250 x 1,030 mm |
Weight | 7,000kg |