X-eye NF120

Mô tả ngắn:Nano-focus X-ray Non-destructive analysis system for Wafer Level PackagingHigh-resolution image with Dual Type CTsTSV, Micro Bump, Pattern

Giá bán : thỏa thuận, vui lòng liên hệ: 0976 275 983/ 0941 88 99 83, email: midtechvn@gmail.com - Mr. Hoàng Anh Quý!

Chi tiết:

Nano-focus X-ray Inspection System
Nano-focus Tube of 200 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.
Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.
Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.

Specifications

X-ray Tube	120 kV / 200 µA
Min. Resolution	0.2㎛
Table Size	12inch wafer
Detector	6 inch FPXD
CT Scan Method	Oblique CT / Cone beam CT
Foot print	2,380 x 1,450 x 2,120 mm Control Box : 600 x 1,250 x 1,030 mm
Weight	7,000kg

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